Ab initio study of deformed As, Sb, and Bi with an application to thin films

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SYSNO	0468483
Title	Ab initio study of deformed As, Sb, and Bi with an application to thin films
Author(s)	Zouhar, M. (CZ) Šob, Mojmír (UFM-A)_{RID, ORCID}
Source Title	Physical Review B. Roč. 94, č. 18 (2016). - : American Physical Society
Article number	184110
Document Type	Článek v odborném periodiku
Grant	LQ1601 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	GA16-24711S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic
Institutional support	UFM-A - RVO:68081723
Language	eng
Country	US
Keywords	AUGMENTED-WAVE METHOD * HIGH-PRESSURE * GROUP-15 ELEMENTS
Cooperating institutions	Masarykova univerzita Brno (Czech Republic) Xura Inc. Brno (Czech Republic)
Permanent Link	http://hdl.handle.net/11104/0266320

Number of the records: 1