- Ab initio study of deformed As, Sb, and Bi with an application to thi…
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Ab initio study of deformed As, Sb, and Bi with an application to thin films

  1. 1.
    SYSNO0468483
    TitleAb initio study of deformed As, Sb, and Bi with an application to thin films
    Author(s) Zouhar, M. (CZ)
    Šob, Mojmír (UFM-A) RID, ORCID
    Source Title Physical Review B. Roč. 94, č. 18 (2016). - : American Physical Society
    Article number184110
    Document TypeČlánek v odborném periodiku
    Grant LQ1601 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    GA16-24711S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic
    Institutional supportUFM-A - RVO:68081723
    Languageeng
    CountryUS
    Keywords AUGMENTED-WAVE METHOD * HIGH-PRESSURE * GROUP-15 ELEMENTS
    Cooperating institutions Masarykova univerzita Brno (Czech Republic)
    Xura Inc. Brno (Czech Republic)
    Permanent Linkhttp://hdl.handle.net/11104/0266320
     
Number of the records: 1  

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