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Ab initio study of deformed As, Sb, and Bi with an application to thin films
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SYSNO 0468483 Title Ab initio study of deformed As, Sb, and Bi with an application to thin films Author(s) Zouhar, M. (CZ)
Šob, Mojmír (UFM-A) RID, ORCIDSource Title Physical Review B. Roč. 94, č. 18 (2016). - : American Physical Society Article number 184110 Document Type Článek v odborném periodiku Grant LQ1601 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic GA16-24711S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic Institutional support UFM-A - RVO:68081723 Language eng Country US Keywords AUGMENTED-WAVE METHOD * HIGH-PRESSURE * GROUP-15 ELEMENTS Cooperating institutions Masarykova univerzita Brno (Czech Republic)
Xura Inc. Brno (Czech Republic)Permanent Link http://hdl.handle.net/11104/0266320
Number of the records: 1