Number of the records: 1
Ab initio study of deformed As, Sb, and Bi with an application to thin films
- 1.Zouhar, M. - Šob, Mojmír
Ab initio study of deformed As, Sb, and Bi with an application to thin films.
Physical Review B. Roč. 94, č. 18 (2016), č. článku 184110. ISSN 2469-9950. E-ISSN 2469-9969
R&D Projects: GA MŠMT(CZ) LQ1601; GA ČR(CZ) GA16-24711S
Impact factor: 3.836, year: 2016 ; AIS: 1.227, rok: 2016
DOI: https://doi.org/10.1103/PhysRevB.94.184110
http://hdl.handle.net/11104/0266320
Number of the records: 1