Number of the records: 1
Ab initio study of deformed As, Sb, and Bi with an application to thin films
- 1.0468483 - ÚFM 2017 RIV US eng J - Journal Article
Zouhar, M. - Šob, Mojmír
Ab initio study of deformed As, Sb, and Bi with an application to thin films.
Physical Review B. Roč. 94, č. 18 (2016), č. článku 184110. ISSN 2469-9950. E-ISSN 2469-9969
R&D Projects: GA MŠMT(CZ) LQ1601; GA ČR(CZ) GA16-24711S
Institutional support: RVO:68081723
Keywords : AUGMENTED-WAVE METHOD * HIGH-PRESSURE * GROUP-15 ELEMENTS
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.836, year: 2016 ; AIS: 1.227, rok: 2016
DOI: https://doi.org/10.1103/PhysRevB.94.184110
Permanent Link: http://hdl.handle.net/11104/0266320
Number of the records: 1