Number of the records: 1
Characterization of thin MnSi and MnGe Layers Prepared by Reactive UV Pulsed Laser Deposition.
- 1.Koštejn, Martin - Fajgar, Radek - Dytrych, Pavel - Kupčík, Jaroslav - Dřínek, Vladislav - Jandová, Věra - Huber, Š. - Novotný, F.
Characterization of thin MnSi and MnGe Layers Prepared by Reactive UV Pulsed Laser Deposition.
Thin Solid Films. Roč. 619, NOV 30 (2016), s. 73-80. ISSN 0040-6090. E-ISSN 1879-2731
Impact factor: 1.879, year: 2016
http://hdl.handle.net/11104/0266707
Number of the records: 1