Number of the records: 1
Characterization of thin MnSi and MnGe Layers Prepared by Reactive UV Pulsed Laser Deposition.
- 1.Koštejn, Martin - Fajgar, Radek - Dytrych, Pavel - Kupčík, Jaroslav - Dřínek, Vladislav - Jandová, Věra - Huber, Š. - Novotný, F.
Characterization of thin MnSi and MnGe Layers Prepared by Reactive UV Pulsed Laser Deposition.
Thin Solid Films. Roč. 619, NOV 30 (2016), s. 73-80. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR GC15-08842J
Impact factor: 1.879, year: 2016 ; AIS: 0.384, rok: 2016
DOI: https://doi.org/10.1016/j.tsf.2016.10.035
http://hdl.handle.net/11104/0266707
Number of the records: 1