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Electron beam induced mass loss dependence on aging of Epon resin sections
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SYSNO ASEP 0452276 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Electron beam induced mass loss dependence on aging of Epon resin sections Author(s) Skoupý, Radim (UPT-D) RID, ORCID, SAI
Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAI
Kočová, L. (CZ)
Nebesářová, Jana (BC-A) RID, ORCIDNumber of authors 4 Source Title 12th Multinational Congress on Microscopy. - Budapest : Akadémiai Kiadó, 2015 - ISBN 978-963-05-9653-4 Pages s. 112-113 Number of pages 2 s. Publication form Online - E Action MCM 2015. Multinational Congress on Microscopy /12./ Event date 23.08.2015-28.08.2015 VEvent location Eger Country HU - Hungary Event type WRD Language eng - English Country HU - Hungary Keywords STEM ; mass loss ; resin ; Epon Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GA14-20012S GA ČR - Czech Science Foundation (CSF) LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UPT-D - RVO:68081731 ; BC-A - RVO:60077344 Annotation It has been recently shown that low voltage STEM (Scanning Transmission Electron Microscope) can be regarded as the method of choice for many studies of biological samples. Main advantage of this technique is that it allows one to image samples with low contrast. Usually, in a standard STEM (typical acceleration voltage 60–300 kV) the image contrast is enhanced by staining using salts of heavy metals (e.g., uranyl acetate, lead citrate). This is not necessarily in low voltage STEM. Consequently, investigated structures are closer to native state of investigated samples. During sample preparation biological material is embedded in a resin which is observed in microscope in a form of ultrathin sections. There is commercially available wide spectrum of resins with different properties for embedding samples in a range from soft tissues to bones. They have various parameters such as hardness, mechanical stability, penetrability. For imaging an important parameter is a sensitivity to degradation by electron beam. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2016
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