Number of the records: 1
Electron beam induced mass loss dependence on aging of Epon resin sections
- 1.Skoupý, Radim - Krzyžánek, Vladislav - Kočová, L. - Nebesářová, Jana
Electron beam induced mass loss dependence on aging of Epon resin sections.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 112-113. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
http://hdl.handle.net/11104/0253305
Number of the records: 1