Number of the records: 1  

MeV ion beams generated by intense pulsed laser monitored by Silicon Carbide detectors

  1. 1.
    SYSNO0448239
    TitleMeV ion beams generated by intense pulsed laser monitored by Silicon Carbide detectors
    Author(s) Calcagno, L. (IT)
    Musumeci, P. (IT)
    Cutroneo, M. (IT)
    Torrisi, L. (IT)
    La Via, F. (IT)
    Ullschmied, Jiří (FZU-D) RID
    Source Title Journal of Physics: Conference Series. Vol. 508. Č. 012009. - Bristol : IOP Publishing, 2014
    Conference Plasma Physics by Laser and Applications 2013 Conference (PPLA2013), 02.10.2013-04.10.2013, Lecce
    Document TypeKonferenční příspěvek (zahraniční konf.)
    Grant 284464, XE - EU countries
    Institutional supportFZU-D - RVO:68378271
    Languageeng
    CountryGB
    Keywords MeV ions * plasma * SiC detector * PALS
    Permanent Linkhttp://hdl.handle.net/11104/0249986
     
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.