Number of the records: 1
MeV ion beams generated by intense pulsed laser monitored by Silicon Carbide detectors
- 1.Calcagno, L. - Musumeci, P. - Cutroneo, M. - Torrisi, L. - La Via, F. - Ullschmied, Jiří
MeV ion beams generated by intense pulsed laser monitored by Silicon Carbide detectors.
Journal of Physics: Conference Series. Vol. 508. Bristol: IOP Publishing, 2014, Č. 012009. ISSN 1742-6588.
[Plasma Physics by Laser and Applications 2013 Conference (PPLA2013). Lecce (IT), 02.10.2013-04.10.2013]
http://hdl.handle.net/11104/0249986
Number of the records: 1