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MeV ion beams generated by intense pulsed laser monitored by Silicon Carbide detectors
- 1.Calcagno, L., Musumeci, P., Cutroneo, M., Torrisi, L., La Via, F., Ullschmied, J. MeV ion beams generated by intense pulsed laser monitored by Silicon Carbide detectors. In: Journal of Physics: Conference Series. Vol. 508. Bristol: IOP Publishing, 2014, č. 012009. ISSN 1742-6588. Available: doi: 10.1088/1742-6596/508/1/012009
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