Number of the records: 1
Testbeam analysis suite for silicon sensors
- 1.0440382 - FZÚ 2015 RIV CZ eng L4 - Software
Kvasnička, Peter - Kodyš, Peter
Testbeam analysis suite for silicon sensors.
Internal code: Testbeam analysis suite for silicon sensors ; 2014
Technical parameters: Software provádí výběr drah, jejich fitování, doladění poloh detektorů, eta korekci polohy a odhad přesnosti rekonstruované polohy dráhy pro křemíkové detektory na testovacích svazcích.
Economic parameters: Produkt je výsledkem základního výzkumu a tudíž neočekáváme přímý zisk nebo úsporu.
R&D Projects: GA MŠMT 7E12050
EU Projects: European Commission(XE) 262025 - AIDA
Institutional support: RVO:68378271
Keywords : silicon detector * testbeam * eta correction * alignment * tracking * sensor resolution
Subject RIV: BF - Elementary Particles and High Energy Physics
http://www-ucjf.troja.mff.cuni.cz/~kodys/works/data_analysis/index.html
The software has been used for analysis of several DEPFET testbeams between 2008 and 2010 (pixel sensors), and also HEPHY testbeam in 2009 (CMS-like strip sensors). It has been used in IPNP, Charles University in Prague, and HEPHY, Vienna. It was presented at several international conferences. During the time, it has proved to be flexible enough to handle specific requirements of different testbeams and testbeam tasks.
Permanent Link: http://hdl.handle.net/11104/0243505
Number of the records: 1