0436442 - FZÚ 2015 RIV GB eng J - Journal Article
Čermák, Jan - Yamada, T. - Ledinský, Martin - Hasegawa, M. - Rezek, Bohuslav
Microscopically inhomogeneous electronic and material properties arising during thermal and plasma CVD of graphene.
Journal of Materials Chemistry C. Roč. 2, č. 42 (2014), s. 8939-8948. ISSN 2050-7526. E-ISSN 2050-7534
R&D Projects: GA ČR GAP108/12/0996; GA ČR GA14-15357S
Institutional support: RVO:68378271
Keywords : graphene * Raman micro-mapping * atomic force microscopy * AFM phase imaging * current-sensing AFM
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 4.696, year: 2014

Correlated microscopic characterization by AFM topography, phase and local current imaging with Raman micro-mapping of graphene layers prepared by plasma and thermal CVD techniques reveals different types of defects in the layers and provides explanation for orders of magnitude different electrical conductivities.
Permanent Link: http://hdl.handle.net/11104/0240184