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Energy loss and online directional track visualization of fast electrons with the pixel detector Timepix

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    SYSNO ASEP0424873
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleEnergy loss and online directional track visualization of fast electrons with the pixel detector Timepix
    Author(s) Granja, C. (CZ)
    Krist, Pavel (UJF-V) RID, ORCID, SAI
    Chvátil, David (UJF-V) RID, SAI, ORCID
    Šolc, J. (CZ)
    Pospíšil, S. (CZ)
    Jakubek, J. (CZ)
    Opalka, L. (CZ)
    Number of authors7
    Source TitleRadiation Measurements. - : Elsevier - ISSN 1350-4487
    Roč. 59, DEC (2013), s. 245-261
    Number of pages17 s.
    Publication formPrint - P
    Languageeng - English
    CountryGB - United Kingdom
    Keywordsinteraction of radiation with matter ; dE/dx detectors ; particle tracking detectors ; hybrid pixel detectors ; active nuclear emulsion ; energy loss
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    Institutional supportUJF-V - RVO:61389005
    UT WOS000329421700039
    EID SCOPUS84889095051
    DOI10.1016/j.radmeas.2013.07.006
    AnnotationThe spectral-, position- and tracking-response of Timepix to energetic electrons has been tested and characterized with well-defined low-intensity parallel beams of monoenergetic electrons in the 7 -21 MeV range. The per-pixel energy sensitivity of Timepix serves as a position-sensitive dE/dx detector to determine the energy loss over along the particle track. The sampling path pitch can be set to 55 mu m (pixel-size) and arbitrary values between 300 mu m (sensor thickness) and nearly 2 mm. Timepix can register and visualize not only the position and trajectories but also the direction of trajectories and the rate of directional scattering of single fast electrons across the semiconductor sensor. The technique serves to measure the spatial distribution of a parallel beam, the beam size spread, transversal beam flux homogeneity and lateral straggling at the pixel-size scale. The mean scattering path along the beam axis and the mean path for lateral beam straggling in silicon can be determined. Measured energy loss distributions were compared with model and previous data as well as with dedicated Monte Carlo MCNPX simulations performed for this work. Tracking distributions were also simulated.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2014
Number of the records: 1  

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