Number of the records: 1  

Experimental and simulation study of stress in diamond grown on silicon

  1. 1.
    SYSNO ASEP0424591
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleExperimental and simulation study of stress in diamond grown on silicon
    Author(s) Jirásek, Vít (FZU-D) RID
    Varga, Marián (FZU-D) RID, ORCID
    Ledinský, Martin (FZU-D) RID, ORCID, SAI
    Ižák, Tibor (FZU-D) RID
    Babchenko, Oleg (FZU-D) RID, ORCID
    Kromka, Alexander (FZU-D) RID, ORCID, SAI
    Source Title4 IC4N (International conference nanoparticles and nanomaterials to nanodevices and nanosystems /4./) Book of Abstracs. - Arlington : University of Texas, 2013 / Meletis E.I. ; Kanellopoulos N. ; Politis C. ; Schommers W.
    S. 74-74
    Number of pages1 s.
    ActionIC4N 2013 International conference from nanoparticles and nanomaterials to nanodevices and nanosystems /4./
    Event date16.06.2013-20.06.2013
    VEvent locationCorfu
    CountryGR - Greece
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsdiamond films ; Raman spectroscopy ; stress ; FEM simulations
    Subject RIVJL - Materials Fatigue, Friction Mechanics
    R&D ProjectsGBP108/12/G108 GA ČR - Czech Science Foundation (CSF)
    LH12186 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271
    AnnotationIn this contribution is studied the stress formed in thin nanocrystalline diamond films deposited on the silicon substrate. The stress is experimentally determined from the Raman shifts of diamond peak, while the theoretical thermal bi-axial stress component is calculated by finite-elements (FEM) method. The stress dependence on the planar geometry is investigated for three configurations: continuous diamond films grown on Si (10 x 10 mm2), b) 100 μm wide diamond strips and c) 200 μm wide diamond strips. Diamond thin films were grown by the standard microwave plasma CVD process. The stripes were prepared either by the selective area deposition (SAD) or by the post-growth etching technique (PGE), respectively.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2014
Number of the records: 1  

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