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Several examples of using contact profilometer for optical surface mapping
- 1.0399550 - FZÚ 2014 RIV US eng C - Conference Paper (international conference)
Havelková, Martina - Hiklová, H.
Several examples of using contact profilometer for optical surface mapping.
Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics /18./. Bellingham: SPIE, 2012 - (Peřina jr., J.; Nožka, L.; Hrabovský, M.; Senderáková, D.; Urbańczyk, W.). Proceedings of SPIE, 8697. ISBN 978-0-8194-9481-8. ISSN 0277-786X.
[Czech-Polish-Slovak optical conference on wave and quantum aspects of contemporary optics /18./. Ostravice (CZ), 03.09.2012-07.09.2012]
Institutional research plan: CEZ:AV0Z10100522
Keywords : contact sensing * contact profilometer * mapping of optical surfaces
Subject RIV: BH - Optics, Masers, Lasers
The number of devices and methods for non-contact solid surface measurement and mapping is growing. Nevertheless contact devices still have value in measuring roughness, waviness and shape measurement. Modern contact devices measure without any negative influence to the surface and are even used for optical and other sensitive surfaces. Some examples are mentioned in the article below.
Permanent Link: http://hdl.handle.net/11104/0226837
Number of the records: 1