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In Situ Measuring System Designed for Improvement of Poly-Si Thin Film Solar Cells
- 1.0390897 - FZÚ 2013 US eng A - Abstract
Pikna, Peter - Fejfar, Antonín - Ledinský, Martin - Vetushka, Aliaksi - Kočka, Jan - Benda, V.
In Situ Measuring System Designed for Improvement of Poly-Si Thin Film Solar Cells.
The Fourth International Forum on Multidisciplinary Education and Research for Energy Science. Honolulu, 2011.
[The Fourth International Forum on Multidisciplinary Education and Research for Energy Science. 17.12.2011-21.12. 2011, Honolulu, Hawaii]
R&D Projects: GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510
EU Projects: European Commission(XE) 240826 - PolySiMode
Institutional research plan: CEZ:AV0Z10100521
Keywords : polycrystalline silicon * thin film solar cells * water vapor passivation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Water vapor passivation seems to be an appropriative alternative to relatively expensive hydrogen plasma treatment for defect passivation in polycrystalline silicon films on glass. This article describes a concept of measurements designed to follow changes in thin film silicon solar cells. Investigations can be carried also in situ, i.e., during the water vapor passivation procedure.
Permanent Link: http://hdl.handle.net/11104/0219767
Number of the records: 1