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Phase transitions in ferroelectric Pb.sub.0.5./sub.Sr.sub.0.5./sub.TiO.sub.3./sub. films probed by spectroscopic ellipsometry

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    SYSNO ASEP0386395
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitlePhase transitions in ferroelectric Pb0.5Sr0.5TiO3 films probed by spectroscopic ellipsometry
    Author(s) Tyunina, Marina (FZU-D) ORCID
    Dejneka, Alexandr (FZU-D) RID, ORCID
    Chvostová, Dagmar (FZU-D) RID, SAI, ORCID
    Levoska, J. (FI)
    Plekh, M. (FI)
    Jastrabík, Lubomír (FZU-D) RID, ORCID
    Source TitlePhysical Review B - ISSN 1098-0121
    Roč. 86, č. 22 (2012), "224105-1"-"224105-6"
    Number of pages6 s.
    Languageeng - English
    CountryUS - United States
    KeywordsPb0.5Sr0.5TiO3 fthin films ; spectroscopic ellipsometry ; phase transitions
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsTA01010517 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    GAP108/12/1941 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z10100522 - FZU-D (2005-2011)
    UT WOS000312023600002
    DOI https://doi.org/10.1103/PhysRevB.86.224105
    AnnotationPhase transitions occurring in Pb0.5Sr0.5TiO3 films are experimentally studied by combining spectroscopic ellipsometry and low-frequency dielectric analysis. Polycrystalline and polydomain epitaxial films with relaxedmisfit strain and columnarmicrostructure are investigated. The paraelectric and the ferroelectric states, and the temperatures and widths of the paraelectric-to-ferroelectric phase transitions, are identified from the temperature evolution of refractive index measured in transparency range. The temperatures at which transitions start on cooling are found to be considerably higher than the temperatures of the dielectric peaks. In contrast to the broad dielectric peaks, the transition width of 60 K in the polycrystalline film and that of 20 K in the polydomain epitaxial film are revealed. The discrepancies between optical and dielectric data are explained by the influence of extrinsic factors on the low-frequency response.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2015
Number of the records: 1  

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