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The smart electronic unit for precise measurement of refractive index of air in a nano-positioning stage for scanning probe microscopy (SPM)

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    0385786 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
    Hucl, Václav - Čížek, Martin - Buchta, Zdeněk - Mikel, Břetislav - Lazar, Josef - Číp, Ondřej
    The smart electronic unit for precise measurement of refractive index of air in a nano-positioning stage for scanning probe microscopy (SPM).
    NANOCON 2012, 4th International Conference Proceedings. Ostrava: TANGER Ltd, 2012, s. 817-821. ISBN 978-80-87294-32-1.
    [NANOCON 2012. International Conference /4./. Brno (CZ), 23.10.2012-25.10.2012]
    R&D Projects: GA MPO FR-TI2/705; GA MPO FR-TI1/241; GA ČR GAP102/10/1813
    Institutional support: RVO:68081731
    Keywords : refractive index of air * precise measurement * laser interferometer
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

    When the traceable measurement of dimensions of samples in scanning probe microscopy is needed the position of the probe tip has to be monitored by a set of laser interferometers. The measurement is done very often during standard atmospheric conditions so the changes of the refractive index of air have an influence to measured values of the length with 1.0exp(-4) relatively. Thus the measurement of the refractive index of air and application of the instantaneous value of the index to all of measurement interferometric axes is necessary. In the work we developed new concept of electronic unit which is able to monitor the refractive index of air on basis of measurement of weather conditions: temperature, humidity and pressure of the air. The unit uses modified Edlen formula for calculation of the refractive index. The next step of the work is verification of accuracy of the measuring capability of the unit. We tested the accuracy with reference unit which measure the refractive index of air by a set of etalon sensors. The expected accuracy of the smart electronic unit falls to the 4.1exp(-7) relatively. The important advantage of the unit is very low power consumption of electronics so the unit causes very small temperature effects to the measuring process.
    Permanent Link: http://hdl.handle.net/11104/0215562

     
     
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