Number of the records: 1
Investigation of multilayer X-ray optics for 6 keV to 20 keV energy range
- 1.
SYSNO ASEP 0380741 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Investigation of multilayer X-ray optics for 6 keV to 20 keV energy range Author(s) Oberta, Peter (FZU-D) RID, ORCID
Platonov, Y. (US)
Flechsig, U. (CH)Number of authors 3 Source Title Journal of Synchrotron Radiation. - : Oxford Blackwell - ISSN 0909-0495
Roč. 19, č. 5 (2012), s. 675-681Number of pages 7 s. Language eng - English Country DK - Denmark Keywords X-ray optics ; multilayer ; energy resolution Subject RIV BH - Optics, Masers, Lasers CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000307700100002 DOI 10.1107/S0909049512032153 Annotation The X-ray optics group at the SLS (Swiss Light Source) in co-operation with RIT (Rigaku Innovative Technologies) has investigated seven different multilayer samples. The goal was to find an ideal multilayer structure for the energy range between 6 keV - 20 keV in terms of energy resolution and reflectivity. Such multilayer structures deposited on substrates can be used as X-ray monochromators or reflecting synchrotron mirrors. The measured reflectivities agree with the simulated ones. They are covering a reflectivity range from 45% - 80% for energies between 6 keV - 10 keV and 80% - 90% for energies between 10 keV - 20 keV. The experimentally measured energy resolution of the samples lies between 0.3% - 3.5%. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2013
Number of the records: 1