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An in-vacuum diffractometer for resonant elastic soft x-ray scattering
- 1.0375044 - FZÚ 2012 RIV US eng J - Journal Article
Hawthorn, D.G. - He, F. - Venema, L. - Davis, H. - Achkar, A.J. - Zhang, J. - Sutarto, R. - Wadati, H. - Radi, A. - Wilson, T. - Wright, G. - Shen, K.M. - Geck, J. - Zhang, H. - Novák, Vít - Sawatzky, G.A.
An in-vacuum diffractometer for resonant elastic soft x-ray scattering.
Review of Scientific Instruments. Roč. 82, č. 7 (2011), 073104/1-073104/8. ISSN 0034-6748. E-ISSN 1089-7623
Institutional research plan: CEZ:AV0Z10100521
Keywords : gallium arsenide * lanthanum compounds * manganese compounds * neodymium * reflectivity * semiconductor thin films * strontium compounds * X-ray diffraction
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.367, year: 2011
We describe the design, construction, and performance of a 4-circle in-vacuum diffractometer for resonant elastic soft x-ray scattering. Example measurements of diffraction and reflectivity in Nd-doped (La,Sr)2CuO4 and thin film (Ga,Mn)As are shown.
Permanent Link: http://hdl.handle.net/11104/0207811
Number of the records: 1