0368388 - ÚPT 2012 RIV DE eng J - Journal Article
Lazar, Josef - Číp, Ondřej - Čížek, Martin - Hrabina, Jan - Buchta, Zdeněk
Standing Wave Interferometer with Stabilization of Wavelength on Air.
tm-Technisches Messen. Roč. 78, č. 11 (2011), s. 484-488. ISSN 0171-8096. E-ISSN 2196-7113
R&D Projects: GA ČR GA102/09/1276; GA ČR GPP102/11/P820; GA AV ČR KAN311610701; GA MŠMT(CZ) LC06007
Institutional research plan: CEZ:AV0Z20650511
Keywords : refractometry * nanopositioning * interferometry * nanometrology
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 0.387, year: 2011
DOI: https://doi.org/10.1524/teme.2011.0201

We present an experimental arrangement of an interferometric system designed to operate with full compensation for varying refractive index of air in the measuring axis. The concept is based on a principle where the wavelength of the laser source is derived not from an optical frequency of the stabilized laser but from a fixed length being a base-plate or a frame of the whole measuring setup. This results into stabilization of the wavelength of the laser source in atmospheric conditions to mechanical length of suitable etalon made of a material with very low thermal expansion. The ultra-low thermal expanding glass ceramic materials available on the market perform thermal expansion coefficients on the level 10-8 which significantly exceeds the limits of uncertainty posed by indirect evaluation of refractive index of air through Edlen formula. This approach represents a contribution primarily to high-resolution and high-precision dimensional metrology in the nanoscale.

Permanent Link: http://hdl.handle.net/11104/0202748