Number of the records: 1
Standing-Wave Interferometer with Stabilization of Wavelength on Air
- 1.
SYSNO ASEP 0368143 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Standing-Wave Interferometer with Stabilization of Wavelength on Air Author(s) Lazar, Josef (UPT-D) RID, ORCID, SAI
Číp, Ondřej (UPT-D) RID, SAI, ORCID
Čížek, Martin (UPT-D) RID, ORCID, SAI
Hrabina, Jan (UPT-D) RID, ORCID, SAI
Buchta, Zdeněk (UPT-D) RID, SAI, ORCIDNumber of authors 5 Source Title Proceedings of the 20th IMEKO TC2 Symposium on Photonics in Measurement. - Aachen : Shaker Verlag, 2011 - ISBN 978-3-8440-0058-0 Pages s. 25-29 Number of pages 5 s. Action IMEKO TC2 Symposium on Photonics in Measurement /20./ Event date 16.05.2011-18.05.2011 VEvent location Linz Country AT - Austria Event type WRD Language eng - English Country DE - Germany Keywords refractometry ; nanopositioning ; interferometry ; nanometrology Subject RIV BH - Optics, Masers, Lasers R&D Projects LC06007 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) KAN311610701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) GA102/09/1276 GA ČR - Czech Science Foundation (CSF) GPP102/11/P820 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z20650511 - UPT-D (2005-2011) Annotation We present an experimental arrangement of an interferometric system designed to operate with full compensation for varying refractive index of air in the measuring axis. The concept is based on a principle where the wavelength of the laser source is derived not from an optical frequency of the stabilized laser but from a fixed length being a base-plate or a frame of the whole measuring setup. This results into stabilization of the wavelength of the laser source in atmospheric conditions to mechanical length of suitable etalon made of a material with very low thermal expansion. The ultra-low thermal expanding glass ceramic materials available on the market perform thermal expansion coefficients on the level 10-8 which significantly exceeds the limits of uncertainty posed by indirect evaluation of refractive index of air through Edlen formula. This approach represents a contribution primarily to high-resolution and high-precision dimensional metrology in the nanoscale. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2012
Number of the records: 1