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Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
- 1.0366182 - FZÚ 2015 RIV DE eng J - Journal Article
Holovský, Jakub - Dagkaldiran, U. - Remeš, Zdeněk - Purkrt, Adam - Ižák, Tibor - Poruba, Aleš - Vaněček, Milan
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates.
Physica Status Solidi A. Roč. 207, č. 9 (2010), s. 578-581. ISSN 1862-6300. E-ISSN 1862-6319
R&D Projects: GA ČR GD202/09/H041; GA ČR GA202/09/0417
EU Projects: European Commission(XE) 38885 - SE-POWERFOIL
Institutional research plan: CEZ:AV0Z10100521
Keywords : solar cell * silicon * spectroscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.458, year: 2010
Fourier transform photocurrent spectroscopy(FTPS)is used as an inspection method for hydrogenated amorphous silicon(a-Si:H)thin films deposited on aluminium foil and aluminium foil coated with rough SnO2. These structures are part of roll-to-roll solar cell fabrication process.
Permanent Link: http://hdl.handle.net/11104/0201253
Number of the records: 1