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Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources
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SYSNO 0359322 Title Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources Author(s) Sobierajski, R. (PL)
Bruijn, S. (NL)
Khorsand, A.R. (NL)
Louis, E. (NL)
van de Kruijs, R.W.E. (NL)
Burian, Tomáš (FZU-D) RID, ORCID
Chalupský, Jaromír (FZU-D) RID, ORCID
Cihelka, Jaroslav (FZU-D)
Gleeson, A. (GB)
Grzonka, J. (PL)
Gullikson, E.M. (US)
Hájková, Věra (FZU-D) RID, ORCID
Hau-Riege, S. (US)
Juha, Libor (FZU-D) RID, ORCID, SAI
Jurek, M. (PL)
Klinger, D. (PL)
Krzywinski, J. (US)
London, R. (US)
Pelka, J. B. (PL)
Płociński, T. (PL)
Rasiński, M. (PL)
Tiedtke, K. (DE)
Toleikis, S. (DE)
Vyšín, Luděk (FZU-D) RID, ORCID
Wabnitz, H. (DE)
Bijkerk, F. (NL)Source Title Optics Express. Roč. 19, č. 1 (2011), s. 193-205. - : Optical Society of America Document Type Článek v odborném periodiku Grant KAN300100801 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100523 - FZU-D (2005-2011) Language eng Country US Keywords laser damage * thermal effects * multilayers * optical design and fabrication * free-electron lasers Permanent Link http://hdl.handle.net/11104/0197124
Number of the records: 1