Number of the records: 1
Microstresses and x-ray diffraction
- 1.0355999 - FZÚ 2011 RIV CZ eng C - Conference Paper (international conference)
Drahokoupil, J. - Čerňanský, Marian - Ganev, N. - Kolařík, K. - Pala, Z.
Microstresses and x-ray diffraction.
Proceedings of the 46th International Scientific Conference Experimental Stress Analysis 2008. Ostrava: VŠB - TU, 2008 - (Fuxa, J.; Macura, F.; Halama, R.), s. 94-98. ISBN 978-80-248-1774-3.
[Experimental Stress Analysis 2008 /46./. Horní Bečva (CZ), 02.06.2008-05.06.2008]
R&D Projects: GA ČR GA106/07/0805
Institutional research plan: CEZ:AV0Z10100520
Keywords : microstress and macrostress * shot peening * x-ray diffraction * depth distribution
Subject RIV: BM - Solid Matter Physics ; Magnetism
The description of an influence of microstresses and macrostresses on diffraction line profiles. Depth distribution of residual stresses in the shot-peened steel obtained by X-ray diffraction.
Permanent Link: http://hdl.handle.net/11104/0194635
Number of the records: 1