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Microstrains and x-ray diffraction
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SYSNO ASEP 0355955 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Microstrains and x-ray diffraction Author(s) Drahokoupil, J. (CZ)
Čerňanský, Marian (FZU-D) RID
Kolařík, K. (CZ)Source Title Proceedings of 47th international Scientific conference Experimental Stress Analysis 2009. - Liberec : Technical University of Liberec, 2009 / Marvalová B. ; Petriková I. ; Čapek L. - ISBN 978-80-7372-483-2 Pages s. 94-98 Number of pages 5 s. Action Experimental Stress Analysis 2009 Event date 08.06.2009-11.06.2009 VEvent location Sychrov Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords microstrain ; x-ray diffraction ; single line ; Voigt function Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GA106/07/0805 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100520 - FZU-D (2005-2011) UT WOS 000274790600014 Annotation An attention is paid to the microstrain – its effect on X-ray diffraction and a method to its estimation from a broadening of diffraction lines. Especially, the single line Voigt function method is presented for the estimation of the microstrain and crystallite size from a single diffraction line. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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