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Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-dyil): fullerene heterostructures detected by Kelvin force microscopy
- 1.0354952 - FZÚ 2011 RIV CH eng J - Journal Article
Čermák, Jan - Rezek, Bohuslav - Cimrová, Věra - Fejfar, Antonín - Purkrt, Adam - Vaněček, Milan - Kočka, Jan
Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-dyil): fullerene heterostructures detected by Kelvin force microscopy.
Thin Solid Films. Roč. 519, č. 2 (2010), s. 836-840. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR GD202/09/H041; GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510; GA MŠMT(CZ) 1M06031
Institutional research plan: CEZ:AV0Z10100521; CEZ:AV0Z40500505
Keywords : photovoltaics * bulk-heterojunction * atomic force microscopy * Kelvin force microscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.909, year: 2010
Thin blend polymer films made of P3HT and fullerene derivatives are studied by Kelvin force microscopy (KFM). Shifting of the surface potential under white light illumination is attributed to free charge carrier generation and redistribution. Decrease of the photo-induced shifting in time is most probably attributed to degradation of the films in air.
Permanent Link: http://hdl.handle.net/11104/0193839
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