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Study of pixel area variations in fully depleted thick CCD
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SYSNO ASEP 0354772 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Study of pixel area variations in fully depleted thick CCD Author(s) Kotov, I.V. (US)
Kotov, A.I. (US)
Frank, J. (US)
Kubánek, Petr (FZU-D) RID
Prouza, Michael (FZU-D) RID, ORCID
O´Connor, P.O. (US)
Radeka, V. (US)
Takacs, P. (US)Source Title High Energy, Optical, and Infrared Detectors for Astronomy IV. - Bellingham : SPIE, 2010 / Holland A.D. ; Dorn D.A. - ISBN 9780819482327 Pages 774206/1-774206/8 Number of pages 8 s. Action High Energy, Optical, and Infrared Detectors for Astronomy /4./ Event date 27.06.2010-04.07.2010 VEvent location San Diego Country US - United States Event type WRD Language eng - English Country US - United States Keywords CCD ; pixel size ; charge diffusion Subject RIV BF - Elementary Particles and High Energy Physics R&D Projects ME09052 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100502 - FZU-D (2005-2011) Annotation Future wide field astronomical surveys, like Large Synoptic Survey Telescope (LSST), require photometric precision on the percent level. The accuracy of sensor calibration procedures should match these requirements. Pixel size variations found in CCDs from different manufacturers are the source of systematic errors in the flat field calibration procedure. To achieve the calibration accuracy required to meet the most demanding science goals this effect should be taken into account. The study of pixel area variations was performed for fully depleted, thick CCDs produced in a technology study for LSST. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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