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Optical and structural study of BST multilayers
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SYSNO ASEP 0354496 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Optical and structural study of BST multilayers Author(s) Železný, Vladimír (FZU-D) RID, ORCID
Chvostová, Dagmar (FZU-D) RID, SAI, ORCID
Pajasová, Libuše (FZU-D) RID
Jelínek, Miroslav (FZU-D) RID, ORCID
Kocourek, Tomáš (FZU-D) RID, ORCID, SAI
Daniš, S. (CZ)
Valvoda, V. (CZ)Source Title Journal of Optoelectronics and Advanced Materials. - : NATL INST OPTOELECTRONICS - ISSN 1454-4164
Roč. 12, č. 3 (2010), 538-541Number of pages 4 s. Language eng - English Country RO - Romania Keywords ellipsometry ; structure ; ferroelectric multilayers Subject RIV BH - Optics, Masers, Lasers R&D Projects GA202/07/0591 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100522 - FZU-D (2005-2011) AV0Z10100520 - FZU-D (2005-2011) UT WOS 000277827900024 EID SCOPUS 77950680243 Annotation Ba0.75Sr0.25TiO3/SrTiO3 multilayers were grown by plasma laser deposition on platinized silicon. Their total thickness was about 300 nm and they consisted of 20 double layers each of thickness 8 nm. X-ray diffraction was used for the characterization of sample microstucture, and surface profiler (alpha step) to determine the film thickness and surface roughness. Optical properties of the multilayers were investigated using spectroscopic ellipsometry and normal-incident reflectivity in the spectral range (1 - 14 eV) at room temperature and their temperature dependence using ellipsometry. The optical parameters of the Pt-coated substrates were fitted using the Drude model and then kept fixed in the subsequent calculation. In the transparent range the spectra were modeled by the Cauchy and Urbach formulas. Direct fit procedure and several models were applied to evaluate optical constants and film thickness. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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