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Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction
- 1.0354219 - FZÚ 2011 RIV US eng J - Journal Article
Holý, V. - Martí, X. - Horák, L. - Caha, O. - Novák, Vít - Cukr, Miroslav - Schülli, T. U.
Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction.
Applied Physics Letters. Roč. 97, č. 18 (2010), 181913/1-181913/3. ISSN 0003-6951. E-ISSN 1077-3118
EU Projects: European Commission(XE) 214499 - NAMASTE
Institutional research plan: CEZ:AV0Z10100521
Keywords : Mn ions * x-ray diffraction * GaAs lattice
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.820, year: 2010
Permanent Link: http://hdl.handle.net/11104/0193270
Number of the records: 1