Development and performance test of picosecond pulse X-ray excited streak camera system for scintillator characterization

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SYSNO ASEP	0353670
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Development and performance test of picosecond pulse X-ray excited streak camera system for scintillator characterization
Author(s)	Yanagida, T. (JP) Fujimoto, Y. (JP) Yoshikawa, A. (JP) Yokota, Y. (JP) Kamada, K. (JP) Pejchal, Jan (FZU-D)_{RID, ORCID} Chani, V. (JP) Kawaguchi, N. (JP) Fukuda, K. (JP) Uchiyama, K. (JP) Mori, K. (JP) Kitano, K. (JP) Nikl, Martin (FZU-D)_{RID, ORCID, SAI}
Source Title	Applied Physics Express - ISSN 1882-0778 Roč. 3, č. 5 (2010), 056202/1-056202/3
Number of pages	3 s.
Language	eng - English
Country	JP - Japan
Keywords	scintillation decay ; streak camera ; picosecond X-ray pulse ; BaF₂
Subject RIV	BM - Solid Matter Physics ; Magnetism
CEZ	AV0Z10100521 - FZU-D (2005-2011)
UT WOS	000277992300021
DOI	10.1143/APEX.3.056202
Annotation	To observe time and wavelength-resolved scintillation events, picosecond pulse X-ray excited streak camera system is developed. The wavelength range spreads from VUV to near infrared region (110-900 nm) and the instrumental response function is around 80 ps. This work describes the principle of the newly developed instrument and the first performance test using BaF2 single crystal scintillator.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2011

Number of the records: 1