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Development and performance test of picosecond pulse X-ray excited streak camera system for scintillator characterization

  1. 1.
    SYSNO ASEP0353670
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleDevelopment and performance test of picosecond pulse X-ray excited streak camera system for scintillator characterization
    Author(s) Yanagida, T. (JP)
    Fujimoto, Y. (JP)
    Yoshikawa, A. (JP)
    Yokota, Y. (JP)
    Kamada, K. (JP)
    Pejchal, Jan (FZU-D) RID, ORCID
    Chani, V. (JP)
    Kawaguchi, N. (JP)
    Fukuda, K. (JP)
    Uchiyama, K. (JP)
    Mori, K. (JP)
    Kitano, K. (JP)
    Nikl, Martin (FZU-D) RID, ORCID, SAI
    Source TitleApplied Physics Express - ISSN 1882-0778
    Roč. 3, č. 5 (2010), 056202/1-056202/3
    Number of pages3 s.
    Languageeng - English
    CountryJP - Japan
    Keywordsscintillation decay ; streak camera ; picosecond X-ray pulse ; BaF2
    Subject RIVBM - Solid Matter Physics ; Magnetism
    CEZAV0Z10100521 - FZU-D (2005-2011)
    UT WOS000277992300021
    DOI10.1143/APEX.3.056202
    AnnotationTo observe time and wavelength-resolved scintillation events, picosecond pulse X-ray excited streak camera system is developed. The wavelength range spreads from VUV to near infrared region (110-900 nm) and the instrumental response function is around 80 ps. This work describes the principle of the newly developed instrument and the first performance test using BaF2 single crystal scintillator.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2011
Number of the records: 1  

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