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Evaluation of defect concentration in doped SWCNT
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SYSNO ASEP 0353077 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Evaluation of defect concentration in doped SWCNT Author(s) Kalbáč, Martin (UFCH-W) RID, ORCID
Kavan, Ladislav (UFCH-W) RID, ORCIDSource Title Physica Status Solidi B : Basic Solid State Physics. - : Wiley - ISSN 0370-1972
Roč. 247, 11-12 (2010), s. 2797-2800Number of pages 4 s. Language eng - English Country DE - Germany Keywords defects ; Raman spectroscopy ; spectroelectrochemistry Subject RIV CG - Electrochemistry R&D Projects GC203/07/J067 GA ČR - Czech Science Foundation (CSF) GAP204/10/1677 GA ČR - Czech Science Foundation (CSF) IAA400400911 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) IAA400400804 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) KAN200100801 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) ME09060 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z40400503 - UFCH-W (2005-2011) UT WOS 000285798400039 DOI 10.1002/pssb.201000180 Annotation In the present study we analyze and discus Raman spectra of doped SWCNTs. We focus on the development of the integral area of the D mode (AD), the TG mode (ATG) and the G′ mode (AG′). It is shown that area of the D band is significantly attenuated in doped carbon nanotubes samples for both semiconducting and metallic tubes. A similar dependence on the doping as in the case of the area of the D mode was found also for the area of the TG and the G′ mode. The area of the G′ mode was found to be more significantly dependent on the electrode potential than the area of the TG mode. However, this difference is only small, hence the AD/AG′ and AD/ATG ratios give only slightly different results in evaluation of the amount of defects in doped SWCNT samples. Workplace J. Heyrovsky Institute of Physical Chemistry Contact Michaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196 Year of Publishing 2011
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