Number of the records: 1  

Laser source for interferometry in nanotechnology

  1. 1.
    SYSNO ASEP0352686
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleLaser source for interferometry in nanotechnology
    Author(s) Hrabina, Jan (UPT-D) RID, ORCID, SAI
    Lazar, Josef (UPT-D) RID, ORCID, SAI
    Číp, Ondřej (UPT-D) RID, SAI, ORCID
    Čížek, Martin (UPT-D) RID, ORCID, SAI
    Number of authors4
    Source Title17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. - Žilina : Žilinská univerzita, 2010 - ISBN 978-80-554-0238-3
    S. 63
    Number of pages1 s.
    ActionSlovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics /17./
    Event date06.09.2010
    VEvent locationLiptovsky Jan
    CountrySK - Slovakia
    Event typeWRD
    Languageeng - English
    CountrySK - Slovakia
    Keywordsatomic force microscopy ; nanometrology ; interferometry
    Subject RIVBH - Optics, Masers, Lasers
    R&D ProjectsLC06007 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    2C06012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    2A-1TP1/127 GA MPO - Ministry of Industry and Trade (MPO)
    FT-TA3/133 GA MPO - Ministry of Industry and Trade (MPO)
    2A-3TP1/113 GA MPO - Ministry of Industry and Trade (MPO)
    GA102/09/1276 GA ČR - Czech Science Foundation (CSF)
    GA102/07/1179 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    AnnotationThe contribution is oriented towards measuring in the nanoscale through local probe microscopy techniques, primarily the AFM microscopy. The need to make the AFM microscope a nanometrology tool not only the positioning of the tip has to be based on precise measurements but the traceability of the measuring technique has to be ensured up to the primary etalon. This leads to the engagement of laser interferometric measuring methods. We present a design of a single-frequency stabilized laser which serves as a laser source for multiaxis position control of a nanopositioning stage. The laser stabilization technique is described together with comparison of frequency stability.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2011
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.