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Electrical Analogy to an Atomic Force Microscope
- 1.0350413 - ÚFE 2011 RIV CZ eng J - Journal Article
Kučera, Ondřej
Electrical Analogy to an Atomic Force Microscope.
Radioengineering. Roč. 19, č. 1 (2010), s. 168-171. ISSN 1210-2512
Institutional research plan: CEZ:AV0Z20670512
Keywords : atomic force microscopy
Subject RIV: JB - Sensors, Measurment, Regulation
Impact factor: 0.503, year: 2010
Several applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit theories in connection with fairly accessible software for circuit analysis make this alternative method easy to use for a wide community of AFM users.
Permanent Link: http://hdl.handle.net/11104/0190426
Number of the records: 1