Number of the records: 1  

Optical line width in semiconductor quantum dots

  1. 1.
    SYSNO ASEP0349148
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleOptical line width in semiconductor quantum dots
    Author(s) Král, Karel (FZU-D) RID
    Menšík, Miroslav (UMCH-V) RID
    Source TitleICTON: 2009 11TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS. - NEW YORK : IEEE, 2009 / Miguel S. - ISBN 978-1-4244-4825-8
    Pagess. 1236-1239
    Number of pages4 s.
    ActionInternational Conference on Transparent Optical Networks /11./
    Event date28.06.2009-02.07.2009
    VEvent locationPonta Delgada University
    CountryPT - Portugal
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsquantum dots ; optical spectra ; electron-phonon interaction
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsME 866 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA202/07/0643 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z10100520 - FZU-D (2005-2011)
    AV0Z40500505 - UMCH-V (2005-2011)
    UT WOS000274048000330
    AnnotationTheory of the lateral size dependence of the optical line width in quantum dots is presented.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2011
Number of the records: 1  

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