Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films

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SYSNO	0347825
Title	Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films
Author(s)	Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Vetushka, Aliaksi (FZU-D)_{RID, ORCID} Kalusová, V. (CZ) Čertík, Ondřej (FZU-D) Ledinský, Martin (FZU-D)_{RID, ORCID, SAI} Rezek, Bohuslav (FZU-D)_{RID, ORCID} Stuchlík, Jiří (FZU-D)_{RID, ORCID} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Source Title	Physica Status Solidi A : Applications and Materials Science. Roč. 207, č. 3 (2010), s. 582-586. - : Wiley
Document Type	Článek v odborném periodiku
Grant	LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	IAA100100902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR), CZ - Czech Republic
CEZ	AV0Z10100521 - FZU-D (2005-2011)
Language	eng
Country	DE
Keywords	conductive atomic force microscopy (C-AFM) * mixed phase silicon thin films
URL	http://dx.doi.org/10.1002/pssa.200982907
Permanent Link	http://hdl.handle.net/11104/0188510

Number of the records: 1