Number of the records: 1
Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films
- 1.Fejfar, Antonín - Vetushka, Aliaksi - Kalusová, V. - Čertík, Ondřej - Ledinský, Martin - Rezek, Bohuslav - Stuchlík, Jiří - Kočka, Jan
Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films.
Physica Status Solidi A. Roč. 207, č. 3 (2010), s. 582-586. ISSN 1862-6300. E-ISSN 1862-6319
Impact factor: 1.458, year: 2010
http://dx.doi.org/10.1002/pssa.200982907
http://hdl.handle.net/11104/0188510
Number of the records: 1