Number of the records: 1
Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films
- 1.0347825 - FZÚ 2011 RIV DE eng J - Journal Article
Fejfar, Antonín - Vetushka, Aliaksi - Kalusová, V. - Čertík, Ondřej - Ledinský, Martin - Rezek, Bohuslav - Stuchlík, Jiří - Kočka, Jan
Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films.
Physica Status Solidi A. Roč. 207, č. 3 (2010), s. 582-586. ISSN 1862-6300. E-ISSN 1862-6319
R&D Projects: GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510; GA AV ČR(CZ) IAA100100902
Institutional research plan: CEZ:AV0Z10100521
Keywords : conductive atomic force microscopy (C-AFM) * mixed phase silicon thin films
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.458, year: 2010
http://dx.doi.org/10.1002/pssa.200982907
Permanent Link: http://hdl.handle.net/11104/0188510
Number of the records: 1