Number of the records: 1
Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films
- 1.FEJFAR, Antonín, VETUSHKA, Aliaksi, KALUSOVÁ, V., ČERTÍK, Ondřej, LEDINSKÝ, Martin, REZEK, Bohuslav, STUCHLÍK, Jiří, KOČKA, Jan. Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films. Physica Status Solidi A. 2010, 207(3), 582-586. ISSN 1862-6300. E-ISSN 1862-6319. Available: doi: 10.1002/pssa.200982907.
Number of the records: 1