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Films of Metal Nanoparticles Deposited on Semiconductors by Electrophoresis: Technology and Characterization
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SYSNO ASEP 0346028 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Films of Metal Nanoparticles Deposited on Semiconductors by Electrophoresis: Technology and Characterization Author(s) Žďánský, Karel (URE-Y)
Zavadil, Jiří (URE-Y) RID
Kacerovský, Pavel (URE-Y)
Kostka, František (URE-Y)
Lorinčík, Jan (URE-Y)
Černohorský, O. (CZ)
Fojtík, A. (CZ)
Müller, M. (CZ)
Kostejn, M. (CZ)Source Title NANOCON 2009 Conference Proceedings. - Ostrava : TANGER, 2009 - ISBN 978-80-87294-13-0 Pages s. 171-178 Number of pages 8 s. Action NANOCON 2009 Event date 20.10.2009-22.10.2009 VEvent location Rožnov pod Radhoštěm Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords semiconductor devices ; nanostructures ; sensors Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects KAN401220801 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) GA102/09/1037 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z20670512 - URE-Y (2005-2011) UT WOS 000277025600025 Annotation Layers of nanoparticles in micelle enclosures were deposited on InP substrates by electrophoresis from isooctane colloid solutions containing Pd or Ag nanoparticles. The layers were investigated by SIMS, low-temperature photoluminescence spectroscopy and topography, absorption spectroscopy, Raman spectroscopy and sensitivity to hydrogen. Photoluminescence of InP was enhanced by the layers of Pd or Ag nanoparticles. Schottky barriers made on the n-type InP with layers containing Pd nanoparticles showed significant sensitivity to hydrogen in contrast to those containing Ag nanoparticles. Workplace Institute of Radio Engineering and Electronics Contact Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488 Year of Publishing 2011
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