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Analysis of painting materials on multimodal microscopic level
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SYSNO ASEP 0342149 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Analysis of painting materials on multimodal microscopic level Author(s) Zitová, Barbara (UTIA-B) RID, ORCID
Beneš, Miroslav (UTIA-B) RID, ORCID
Hradilová, J. (CZ)
Hradil, David (UACH-T) RID, SAI, ORCIDSource Title Proceedings of SPIE IS&T/SPIE Electronic Imaging 2010, Computer Vision and Image Analysis of Art, 7531. - San Jose : SPIE, 2010 / Stork D. G. ; Coddington J. ; Bentkowska-Kafel A. - ISSN 0277-786X - ISBN 978-0-8194-7924-2 Pages 75310f-1-75310f-9 Number of pages 9 s. Publication form www - www Action IS&T/SPIE Electronic Imaging 2010 Event date 17.01.2010-21.01.2010 VEvent location San Jose Country US - United States Event type WRD Language eng - English Country US - United States Keywords material image analysis ; digital restoration ; image retrieval Subject RIV JC - Computer Hardware ; Software R&D Projects 1M0572 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA203/07/1324 GA ČR - Czech Science Foundation (CSF) GA102/08/1593 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10750506 - UTIA-B (2005-2011) AV0Z40320502 - UACH-T (2005-2011) UT WOS 000283783900013 DOI https://doi.org/10.1117/12.838872 Annotation Our paper introduces a system based on digital image processing algorithms designed to facilitate analysis of painting materials during artwork conservation. Microscopic images of minute samples - cross sections – from the artworks are scanned using visible and ultraviolet spectra and under scanning electron microscope. Firstly, the scans are registered to remove geometrical differences. The multimodal nature of the problem led to the application of mutual information. The image quality is maximized by means of blind deconvolution methods. Cross-sections are then segmented to individual layers and distinctive seeds. For the image retrieval part, which facilitates further analyzes and conclusions, the layers are represented by means of wavelet analysis and secondorder statistics. The library of such features can be connected to the time of creation and differences between vectors of the same materials but from different paintings can help during a painter authentication. Workplace Institute of Information Theory and Automation Contact Markéta Votavová, votavova@utia.cas.cz, Tel.: 266 052 201. Year of Publishing 2011
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