The effect of annealing of Eu:Y2O3/alumina nanostructures thin film

0340027 - FZÚ 2010 US eng A - Abstract
Lančok, Ján - Novotný, Michal - Bulíř, Jiří - Garapon, C. - Martinet, C. - Guy, S. - Klementová, Mariana
The effect of annealing of Eu:Y2O3/alumina nanostructures thin film.
E-MRS 2008 Spring Meeting. Warrendale, PA: MRS, 2008. BP125. ISBN N.
[E-MRS 2008 Spring Meeting. 26.05.2008-30.05.2008, Strasbourg]
Institutional research plan: CEZ:AV0Z10100522
Keywords : pulsed laser deposition * waveguides * laser annealing * rapid thermal annealing
Subject RIV: BH - Optics, Masers, Lasers

We studied the Eu3+ doped Y2O3 crystalline nanostructures embedded in amorphous alumina waveguides. These samples were prepared by alternating pulsed laser deposition at substrate temperature above 500°C. We proposed to improve on structural properties of the nanocomposite films via a post deposition laser annealing using KrF and XeCl excimer lasers and Rapid Thermal Annealing (RTA) of amorphous nanocomposites elaborated at low substrate temperature. The lasers were chosen due to high absorption of Y2O3 matrix, Eu3+ ions and high transparency for amorphous alumina film. Laser annealing was carried out at various laser power densities, number of laser pulses and oxygen pressures. The RTA was performed by means of pulsed halogen lamp in vacuum and oxygen ambient. The corresponding variations in the structural, fluorescence and optical properties of the Eu:Y2O3/alumina films were measured using XRD, TEM, time resolved fluorescence, spectrophotonic and ellipsometric measurements.
Permanent Link: http://hdl.handle.net/11104/0183358