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Damage studies of multilayer optics for XUV free electron lasers
- 1.LOUIS, E., KHORSAND, A.R., SOBIERAJSKI, R., VAN HATTUM, E.D., JUREK, M., KLINGER, D., PELKA, J. B., JUHA, Libor, CHALUPSKÝ, Jaromír, CIHELKA, Jaroslav, HÁJKOVÁ, Věra, JASTROW, U., TOLEIKIS, S., WABNITZ, H., TIEDTKE, K.I., GAUDIN, J., GULLIKSON, E.M., BIJKERK, F. Damage studies of multilayer optics for XUV free electron lasers. In: JUHA, L., BAJT, S., SOBIERAJSKI, R., eds. Damage to VUV, EUV, and X-ray Optics II. Bellingham: SPIE, 2009, 73610I /1-73610I /6. Proceedings of SPIE, 7361. ISBN 9780819476357. ISSN 0277-786x. Available: http://dx.doi.org/10.1117/12.822257
Number of the records: 1