Number of the records: 1
Interaction of intense ultrashort XUV pulses with silicon
- 1.SOBIERAJSKI, R., KLINGER, D., JUREK, M., PELKA, J. B., JUHA, L., CHALUPSKÝ, J., CIHELKA, J., HÁJKOVÁ, V., VYŠÍN, L., JASTROW, U., STOJANOVIC, N., TOLEIKIS, S., WABNITZ, H., KRZYWINSKI, J., HAU-RIEGE, S., LONDON, R. Interaction of intense ultrashort XUV pulses with silicon. In: JUHA, L., BAJT, S., SOBIERAJSKI, R., eds. Damage to VUV, EUV, and X-ray Optics II. Bellingham: SPIE, 2009, 736107/1-736107/11. Proceedings of SPIE, 7361. ISBN 9780819476357. ISSN 0277-786x. Available: http://dx.doi.org/10.1117/12.822152
Number of the records: 1