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Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle
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SYSNO ASEP 0334026 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle Title Studium poškozování amorfního uhlíku ozařovaného femtosekundovými pulsy měkkého rentgenového záření nad a pod kritickým úhlem Author(s) Chalupský, Jaromír (FZU-D) RID, ORCID
Hájková, Věra (FZU-D) RID, ORCID
Altapova, V. (DE)
Burian, T. (CZ)
Gleeson, A.J. (GB)
Juha, Libor (FZU-D) RID, ORCID, SAI
Jurek, M. (PL)
Sinn, H. (DE)
Störmer, M. (DE)
Sobierajski, R. (PL)
Tiedtke, K. (DE)
Toleikis, S. (DE)
Tschentscher, T. (DE)
Vyšín, Luděk (FZU-D) RID, ORCID
Wabnitz, H. (DE)
Gaudin, J. (DE)Source Title Applied Physics Letters. - : AIP Publishing - ISSN 0003-6951
Roč. 95, č. 3 (2009), 031111/1-031111/3Number of pages 3 s. Language eng - English Country US - United States Keywords amorphous state ; carbon ; coatings ; graphitisation ; laser beam effects ; nanostructured materials ; phase transformations ; reflectivity Subject RIV BH - Optics, Masers, Lasers R&D Projects KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAAX00100903 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100523 - FZU-D (2005-2011) UT WOS 000268405300011 DOI 10.1063/1.3184785 Annotation We present results of damage studies conducted at the Free Electron LASer in Hamburg (FLASH) facility with 13.5 nm (91.8 eV) and 7 nm (177.1 eV) radiations. The laser beam was focused on a sample of 890-nm-thick amorphous carbon coated on a silicon wafer mimicking a x-ray mirror. The fluence threshold for graphitization was determined for different grazing angles above and below the critical angle. The observed angular dependence of F-th is explained by the variation in absorption depth and reflectivity. Moreover, the absorbed local dose needed for the phase transition leading to graphitization is shown to vary with the radiation wavelength. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2010
Number of the records: 1