Structure and stability of semiconductor tip apexes for atomic force microscopy

Number of the records: 1

1.

SYSNO ASEP	0328715
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Structure and stability of semiconductor tip apexes for atomic force microscopy
Title	Struktura a stabilita polovodičových hrotů pro mikroskop atomárních sil
Author(s)	Pou, P. (ES) Ghasemi, S.A. (CH) Jelínek, Pavel (FZU-D)_{RID, ORCID} Lenosky, T. (US) Goedecker, S. (CH) Perez, R. (ES)
Number of authors	6
Source Title	Nanotechnology. - : Institute of Physics Publishing - ISSN 0957-4484 Roč. 20, č. 26 (2009), 264015/1-264015/10
Number of pages	10 s.
Language	eng - English
Country	GB - United Kingdom
Keywords	AFM ; first principles simulations ; DFT ; force spectroscopy
Subject RIV	BM - Solid Matter Physics ; Magnetism
R&D Projects	KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	IAA100100905 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z10100521 - FZU-D (2005-2011)
UT WOS	000266900800016
DOI	10.1088/0957-4484/20/26/264015
Annotation	Here we present a detailed and systematic study of the most common structures that can be expected at the apex of the Si tips used in experiments.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2010

Number of the records: 1