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Structure and stability of semiconductor tip apexes for atomic force microscopy
- 1.Pou, P., Ghasemi, S.A., Jelínek, P., Lenosky, T., Goedecker, S., Perez, R. Structure and stability of semiconductor tip apexes for atomic force microscopy. Nanotechnology. 2009, 20(26), 264015/1-264015/10. ISSN 0957-4484. E-ISSN 1361-6528. Available: doi: 10.1088/0957-4484/20/26/264015
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