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Characterization of polystyrene and doped polymethylmethacrylate thin layers

    1.
    SYSNO0307936
    TitleCharacterization of polystyrene and doped polymethylmethacrylate thin layers
    TitleCharakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu
    Author(s) Podgrabinski, T. (CZ)
    Hrabovská, E. (CZ)
    Švorčík, V. (CZ)
    Hnatowicz, Vladimír (UJF-V) RID
    Source Title Journal of Materials Science-Materials in Electronics. Roč. 16, 11-12 (2005), s. 761-765. - : Springer
    Document TypeČlánek v odborném periodiku
    Grant GA106/03/0514 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z10480505 - UJF-V (2005-2011)
    Languageeng
    CountryNL
    Keywords dielectrical properties
    Permanent Linkhttp://hdl.handle.net/11104/0160560
     
Number of the records: 1  

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