Podgrabinski, T. - Hrabovská, E. - Švorčík, V. - Hnatowicz, Vladimír
Characterization of polystyrene and doped polymethylmethacrylate thin layers.
Journal of Materials Science-Materials in Electronics. Roč. 16, 11-12 (2005), s. 761-765. ISSN 0957-4522. E-ISSN 1573-482X
R&D Projects: GA ČR GA106/03/0514
Impact factor: 0.781, year: 2005
http://hdl.handle.net/11104/0160560