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Characterization of polystyrene and doped polymethylmethacrylate thin layers
- 1.PODGRABINSKI, T., HRABOVSKÁ, E., ŠVORČÍK, V., HNATOWICZ, Vladimír. Characterization of polystyrene and doped polymethylmethacrylate thin layers. Journal of Materials Science-Materials in Electronics. 2005, 16(11-12), 761-765. ISSN 0957-4522. E-ISSN 1573-482X.
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