Number of the records: 1
Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope with InAs as based electrode
- 1.VANIŠ, Jan, CHOW, D. H., PANGRÁC, Jiří, ŠROUBEK, Filip, MCGILL, T. C., WALACHOVÁ, Jarmila. Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope with InAs as based electrode. Physica Status Solidi C. 2003, 0(3), 986-991. ISSN 1610-1634.
Number of the records: 1
