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Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope with InAs as based electrode

  1. 1.
    VANIŠ, Jan, CHOW, D. H., PANGRÁC, Jiří, ŠROUBEK, Filip, MCGILL, T. C., WALACHOVÁ, Jarmila. Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope with InAs as based electrode. Physica Status Solidi C. 2003, 0(3), 986-991. ISSN 1610-1634.

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